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Two-Dimensional X-Ray Diffraction

Two-Dimensional X-Ray Diffraction


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About the Book

Die zweidimensionale Röntgendiffraktion ist die ideale, zerstörungsfreie Analysemethode für Proben aller Art. Hierzu gehören Metalle, Polymere, Keramiken, Halbleiter, Dünnfilme, Beschichtungen, Farben, Biomaterialien, Verbundstoffe u.v.m. Die 2. Auflage von Two-Dimensional X-Ray Diffraction erläutert als aktuelles Referenzwerk, wie die neuesten 2D-Dektektoren in Diffraktometer integriert werden, wie sich mithilfe eines 2D-Detektors für Diffraktometer die besten Daten gewinnen lassen und wie die Daten zu interpretieren sind. Überaus hilfreich für alle, die die 2D-Diffraktion im eigenen Labor umsetzen möchten, sind die Ausführungen des Autors zu den physikalischen Prinzipien, zur Projektionsgeometrie und zu mathematischen Ableitungen.
- Bietet neue Inhalte in allen Kapiteln. Die meisten Abbildungen sind gänzlich in Farbe und zeigen so mehr Einzelheiten in den Illustrationen und Diffraktionsmustern.
- Deckt die jüngsten Fortschritte in der Detektortechnik und bei Strategien zur zweidimensionalen Datensammlung ab, die dazu geführt haben, dass 2D-Detektoren verstärkt in der Röntgendiffraktion zum Einsatz kommen.
- Behandelt ausführlich neue Innovationen im Hinblick auf Röntgenquellen, Optik, Systemkonfigurationen, Anwendungen und Algorithmen zur Datenevaluierung.
- Enthält neue Methoden und Beispiele für Versuchsaufbauten für Belastungs-, Textur-, Kristallgröße-, Kristallorientierungs- und Dünnfilmanalysen.

Die 2. Auflage von Two-Dimensional X-Ray Diffraction ist ein wichtiges Referenzwerk für Forscher und Entwickler in den Materialwissenschaften, der Chemie und Physik sowie im Pharmabereich, sowohl in der Industrie als auch im universitären Umfeld, und für alle, die die Röntgendiffraktion als Charakterisierungsverfahren einsetzen. Dieses Nachschlagewerk darf in der Handbibliothek von Anwendern auf allen Ebenen, von Gerätetechnikern, Managern in Röntgenlabors und Geräteentwicklern nicht fehlen.

About the Author:

Bob B. He, PhD, is Director of Innovation and Business Development XRD2 at Bruker AXS-an industry leader in X-ray diffraction instrumentation and solutions (formally Siemens AXS). Dr. He holds 17 U.S. patents and two R&D 100 awards in XRD instrumentation. In recognition of his contribution to the XRD community, he has been recently awarded ICDD Fellow. He earned his doctorate in materials science from Virginia Tech.


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Product Details
  • ISBN-13: 9781119356103
  • Publisher: Wiley
  • Publisher Imprint: Wiley
  • Edition: 2nd Edition
  • Language: English
  • Returnable: Y
  • Weight: 1006 gr
  • ISBN-10: 1119356105
  • Publisher Date: 26 Jun 2018
  • Binding: Hardback
  • Height: 257 mm
  • No of Pages: 496
  • Spine Width: 23 mm
  • Width: 180 mm


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