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Home > Technology & Engineering > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration

Engineering measurement & calibration

13 results found
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1.
Pattern Recognition
Pattern Recognition
By: Rajjan Shinghal, Rajjan (Professor Emeritus Shinghal, Rajjan (Professor Emeritus, Department of Computer Science, Concordia University, Montreal) Shinghal, Rajjan (Professor Emeritus, Department of Computer Science, Professor Emeritus, Department of Computer Science, Concordia University, Montreal) Shinghal
Publisher: OUP India
No Review Yet
AED51
Binding:
Paperback
Release:
28 Feb 2006
Available
Ships within 2-4 Days Explain..
2.
ASQ Metrology HandbookNR
ASQ Metrology Handbook
By: Heather A Wade
Publisher: American Society for Quality Press
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AED636
Binding:
Hardback
Release:
04 Jan 2023
Language:
English
International Edition
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3.
Personal Money and World GovernmentsNR
Personal Money and World Governments
By: Gilbert Graham
Publisher: Tellwell Talent
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AED127
Binding:
Hardback
Release:
24 Mar 2022
Language:
English
International Edition
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4.
Personal Money and World GovernmentsNR
Personal Money and World Governments
By: Gilbert Graham
Publisher: Tellwell Talent
No Review Yet
AED104
Binding:
Paperback
Release:
24 Mar 2022
Language:
English
International Edition
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5.
World Class Maintenance ManagementPOD/NR
World Class Maintenance Management
By: Rolly Angeles, Charles Robert Nelms, Nelms Robert, Robert Nelms
Publisher: Rolando Santiago Angeles
No Review Yet
AED365
Binding:
Hardback
Release:
02 Apr 2018
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Physics and Experiments with Future Linear E+e- Colliders
Physics and Experiments with Future Linear E+e- Colliders
By: Adam Para, A Para, H E Fisk, Eugene H Fisk
Publisher: American Institute of Physics
No Review Yet
AED721
Binding:
Hardback
Release:
27 Jul 2001
Language:
English
Available
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7.
The Ten Commandments for Effective StandardsPOD/NR
The Ten Commandments for Effective Standards
By: Karen Bartleson
Publisher: Synopsys Press
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AED109
Binding:
Hardback
Release:
07 May 2010
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
8.
Signal Processing for Industrial Diagnostics
Signal Processing for Industrial Diagnostics
By: T.J. Ledwidge
Publisher: John Wiley and Sons Ltd
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AED316
Binding:
Hardback
Release:
28 May 1996
Available
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9.
Geometric Design Tolerancing: Theories, Standards and Applications
Geometric Design Tolerancing: Theories, Standards and Applications
By: Hoda A. Elmaraghy, Hoda A ElMaraghy
Publisher: Springer
No Review Yet
AED479
Binding:
Hardback
Release:
28 Feb 1998
Language:
English
Available
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10.
Rotating Machinery
Rotating Machinery
By: J.H. Kim
Publisher: Taylor & Francis Inc
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AED539
Binding:
Hardback
Release:
01 May 1992
Language:
English
Available
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11.
Maintenance of Process Instrumentation in Nuclear Power Plants
Maintenance of Process Instrumentation in Nuclear Power Plants
By: H.M. Hashemian, H. M. Hashemian, H M Hashemian
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED656
Binding:
Paperback
Release:
30 Nov 2010
Language:
English
Available
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12.
Search for Scalar Top Quarks and Higgsino-Like Neutralinos
Search for Scalar Top Quarks and Higgsino-Like Neutralinos
By: Takuya Nobe
Publisher: Springer
No Review Yet
AED322
Binding:
Hardback
Release:
08 Dec 2015
Language:
English
Available
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13.
Introduction to Focused Ion Beam NanometrologyPOD/NR
Introduction to Focused Ion Beam Nanometrology
By: David C. Cox, David C Cox
Publisher: Morgan & Claypool
No Review Yet
AED170
Binding:
Paperback
Release:
01 Oct 2015
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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